The Key Note Speech at the first E\PCOS 2001 was delivered by Dr. Stanford Ovshinsky, the father of Phase Change Technology.
Papers presented at E\PCOS 2001:
Optical Phase Change Memories - Basic Premisis, Future Possibilities
Stan Ovshinsky, Energy Conversion Devices, U.K.
Next Generation Blue-Violet Laser Multi-Layer Optical Recording
Dr. Isao Sato, Matsushita Electric Industrial, Japan
High-Density Recording and Plasmon Technologies in Phase Change Films
Dr. Junji Tominaga, Laotech-Aist, Japan
Study on Optical Disk Testing Method
Prof. Takahiro Kubo, Hiroshima Kokusai University, Japan
Phase-change optical disk and ultra short-pulse laser response for future advancement
Dr. Takeo Ohta, Matsushita Electric Industrial, Japan
Crystallization mechanism in eutectic materials of phase-change optical memory
Prof. Masahiro Okuda, Okuda Tech. Inst., Japan
Structural optical and mechanical properties of phase change materials
Prof. Matthias Wuttig, RWTH-Aachen, Germany
Amorphization and crystallization simulation method and the optimum layer structure
Dr. Takeshi Maeda, Hitachi Central Research Lab, Japan
A basic concept for next generation DVD.
Mr. Toshiro Sugaya, Toshiba Corp., Japan
DVD-RAM 4.7: Media development and transition from lab to massproduction.
Mr. Wayne Wang, Ritek Corp., Taiwan
Mr. Gerald Reynolds, Unaxis Nimbus, U.K.
X-ray analytics of amorphous and crystalline phases of GST/AIST Phase Change Materials
Dr. Markus Michler, NTB, Switzerland
The phenomenon of the initialisation of phase-change optical memory
Dr. Eiji Sahota, Hitachi Computer Peripherals, Japan
Simulation of the writing and erasing processes in optical discs based on phase change material.
Dr. Ludovic Poupinet , LETI Grenoble, France
Local structure of amorphous and crystalline GeTe and GeSbTe
Dr. Berangere Hyot , LETI Grenoble, France
In-line inspection and measurement of DVD-RAM.
Ms. Loreta Dürre, Dr. Schenk GmbH, Germany
Electric Force Microscopy for the Characterisation of Phase-Change Storage Materials
Dr. Jose Christobal Valera-Perez, University of Exeter, U.K.
Performance of PRML Channels with Mark Edge Jitter and Signal Non-Linearities in High-Density Phase Change Recording
Dr. Venkatesh Vadde, Nokia Rearch Center, Finland