Poster Session at E\PCOS 2008
At E\PCOS 2008 in Prague, for the first time a poster session with 12 posters will be orgnized:
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Degradation Mechanism and Curing Method of Phase Change Memory (PCM)
Device Characteristics during Cyclic Programming
Suyoun Lee, Korea Institute of Science and Technology, Seoul 136-791, Korea -
Monte Carlo simulation of charge transport in amorphous GST
Enrico Piccinini, Advanced Research Center on Electronic Systems, and D epartment of Electronics, Computer Science and Systems, University of Bologna, I-40136 Bologna, Italy -
Low power writing in lateral type phase-change memory
Sumio Hosaka, Department of Nano-Material Systems, Graduate School of Engineering, Gunma University, Kiryu, Gunma 376-8515, Japan -
Investigation on the improved superresolution effect by nitrogen addition in Ge-doped SbTe
Hyun Seok Lee, Thin Film Materials Research Center, Korea Institute of Science and Technology, Sungbuk-ku, Seoul 136-791, Korea -
Structural and Thermal Properties of Phase Change on Materials in Nanometer Scale
Bong-Sub Lee , Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA -
Sub-nanosecond structural observations of the optical recording process
using time-resolved x-ray absorption spectroscopy
Paul Fons, Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology, Ibaraki Tsukuba 305-8562, Japan -
Reduction in crystallization time of Sb:Te films through addition of Bi
R. E. Simpson, Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology, Ibaraki Tsukuba 305-8562, Japan -
Crystallization study of reamorphized-Ge2Sb2Te5 sandwiched by dielectric films
Takayuki Shima, Center for Applied Near-Field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology, Ibaraki Tsukuba 305-8562, Japan -
Structural relaxation in chalcogenide-based phase change memories (PCMs):
from defect-annihilation kinetic to device-reliability prediction
S. Lavizzari, Dipartimento di Elettronica e Informazione, Politecnico di Milano and IU.NET, 20133 Milano, Italy -
Medium Long Term Thermal Stability of Flash Evaporated films with composition of Ge2Sb2Te5
Tomas Wagner, University of Pardubice, Faculty of Chemical Technology, Department of General and Inorganic Chemistry and Research Centre, Czech Republic -
RF magnetron sputtering of Se doped Ge-Sb-Te thin films
J. Gutwirth, University of Pardubice, Faculty of Chemical Technology, Department of General and Inorganic Chemistry and Research Centre, Czech Republic -
Comparison of laser induced crystallization process of undoped and Ag
doped Sb40S60 and Sb33S67 thin films
J. Gutwirth, University of Pardubice, Faculty of Chemical Technology, Department of General and Inorganic Chemistry and Research Centre, Czech Republic -
Optical and Electrical Propoerties of Sb-rich Sb-Se System Thin Films.
L. Hromadko, University of Pardubice, Faculty of Chemical Technology, Department of General and Inorganic Chemistry and Research Centre, Czech Republic -
Reduction of programming current density with isotropic PCM deep scaling.
L. Semyon D. Savransky, The TRIZ Experts , 6015 PepperTree Court, Newark, CA 94560, USA